Human reliability analyses by random hazard rate approach

Author： Chiodo E.   Gagliardi F.   Pagano M.  

Publisher： Emerald Group Publishing Ltd

ISSN： 0332-1649

Source： COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.23, Iss.1, 2004-03, pp. : 65-78

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