Dynamical analysis for flaw shape identification in non linear eddy current tests

Author: Cacciola Matteo   Costantino Domenico   Morabito Francesco Carlo   Versaci Mario  

Publisher: Emerald Group Publishing Ltd

ISSN: 0332-1649

Source: COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.26, Iss.4, 2007-08, pp. : 1081-1094

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