Characterization of a 3D defect using the expected improvement algorithm

Author： Bilicz Sándor   Vazquez Emmanuel   Lambert Marc   Gyimóthy Szabolcs   Pávó József  

Publisher： Emerald Group Publishing Ltd

ISSN： 0332-1649

Source： COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.28, Iss.4, 2009-07, pp. : 851-864

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