Space mapping methodology for defect recognition in eddy current testing ‐ type NDT

Author： Putek Piotr Crevecoeur Guillaume Slodicka Marian Keer Roger van Wiele Ben Van de Dupré Luc

ISSN： 0332-1649

Source： COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.31, Iss.3, 2012-05, pp. : 881-894

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