Ohno's Model Revisited: Measuring the Frequency of Potentially Adaptive Mutations under Various Mutational Drifts

Author: Bershtein Shimon   Tawfik Dan S.  

Publisher: Oxford University Press

ISSN: 0737-4038

Source: Molecular Biology and Evolution, Vol.25, Iss.11, 2008-11, pp. : 2311-2318

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Abstract