Spectroscopy in Catalysis
：An Introduction
Publication subTitle ：An Introduction
Author： J. W. Niemantsverdriet
Publisher： John Wiley & Sons Inc
Publication year： 2008
E-ISBN: 9783527614134
P-ISBN(Hardback): 9783527302000
Subject： O643.3 catalytic
Language： ENG
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Description
'Spectroscopy in Catalysis' describes the most important modern analytical techniques used to investigate catalytic surfaces. These include electron spectroscopy (XPS, UPS, AES, EELS), ion spectroscopy (SIMS, SNMS, RBS, LEIS), vibrational spectroscopy (infrared, Raman, EELS), temperature-programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM, SEM, STEM, STM, AFM, FEM, and FIM). Each chapter uses current applications to illustrate the type of information that the technique provides and evaluates its possibilities and limitations.
This second edition includes significant new developments, for example scanning probe microscopies, the imaging and vibrational techniques have been revised, the case studies expanded with an example on polymerization catalysts, and all the other chapters updated with recent examples and relevant new literature.
From reviews of the First Edition:
'This is a truly valuable book ... very useful for industrial practitioners who need to be aware of the type of information that can be obtained from modern surface spectroscopies .... The book has a superb pedagogic value...'
Journal of Catalysis
'... this is an excellent text on spectroscopies in catalysis and I highly recommend it for ... introductory courses on heterogeneous catalysis or as a general introductory monograph.'
Journal of the American Chemical Society
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