Author: Szilagyi Robert Frei Heinz Schlachter Alfred
Publisher: Taylor & Francis Ltd
ISSN: 0894-0886
Source: Synchrotron Radiation News, Vol.19, Iss.1, 2006-03, pp. : 14-15
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
INDUSTRIAL APPLICATIONS OF EXAFS/XANES
Le Journal de Physique Colloques, Vol. 47, Iss. C8, 1986-12 ,pp. :
X-RAY ABSORPTION SPECTROSCOPY (L
Le Journal de Physique Colloques, Vol. 47, Iss. C8, 1986-12 ,pp. :
HIGH RESOLUTION EXAFS-XANES SPECTROMETER
Le Journal de Physique Colloques, Vol. 47, Iss. C8, 1986-12 ,pp. :