High-pressure X-ray near-edge absorption study of thallium rhenium oxide up to 10.86 GPa

Author: Ablett J. M.   Kao C. C.   Shieh S. R.   Mao H.-K.   Croft M.   Tyson T. A.  

Publisher: Taylor & Francis Ltd

ISSN: 0895-7959

Source: International Journal of High Pressure Research, Vol.23, Iss.4, 2003-12, pp. : 471-476

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