Serial Inspection Plan in the Presence of Inspection Errors: Maximum Likelihood and Maximum Entropy Approaches

Author: Chun Young  

Publisher: Taylor & Francis Ltd

ISSN: 0898-2112

Source: Quality Engineering, Vol.17, Iss.4, 2005-10, pp. : 627-632

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract