Author: Zhu Junjia Lin Dennis
Publisher: Taylor & Francis Ltd
ISSN: 0898-2112
Source: Quality Engineering, Vol.22, Iss.1, 2010-01, pp. : 1-12
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A Process Yield for Simple Linear Profiles
By Wang Fu-Kwun
Quality Engineering, Vol. 26, Iss. 3, 2014-07 ,pp. :
Altimeters for Linear Measurements
By Etingof M.
Measurement Techniques, Vol. 56, Iss. 8, 2013-11 ,pp. :
The Monitoring of Vapor Leakages
Measurement Techniques, Vol. 48, Iss. 6, 2005-06 ,pp. :