Thickness Measurements of Thin Perfluoropolyether Polymer Films on Silicon and Amorphous-Hydrogenated Carbon with X-Ray Reflectivity, ESCA and Optical Ellipsometry

Author： Toney M.F.   Mate C.M.   Leach K.A.   Pocker D.  

Publisher： Academic Press

ISSN： 0021-9797

Source： Journal of Colloid and Interface Science, Vol.225, Iss.1, 2000-05, pp. : 219-226

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