Preparation of Ag 5- x Te 3 Thin Films and Confirmation of Their Crystal Structure by High Resolution Electron Microscopy

Author: Kalin W.   Gunter J.R.  

Publisher: Academic Press

ISSN: 0022-4596

Source: Journal of Solid State Chemistry, Vol.123, Iss.2, 1996-05, pp. : 391-397

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Abstract

Single crystalline thin films of Ag 5- x Te 3 (Steutzite) have been prepared from thin silver films and tellurium vapour and their crystal structure is compared to crystal structures formerly determined by various authors using X-ray and electron diffraction. The occurrence of one of these structures in our films is confirmed by means of electron diffraction and high resolution electron microscopy with image simulation, whereas others could be rejected. These thin films crystallize in the P 6¯2 m space group with a = b = 1.3456(9) nm and c = 1.6917(9) nm. The crystal structure of Ag 5- x Te 3 ( x = 0.47) can be described as a superstructure of tellurium. The lattice constants a and b of the basic tellurium structure are modulated with a period of 3. Each third spiral chain of the tellurium crystal structure is retained in the tellurium sublattice of Ag 4.53 Te 3 . Along [00 z ] Ag 4.53 Te 3 , the tellurium chains are elongated by 36% in comparison to [00 z ] Te .