The Scanning–Tunneling Microscopy, the X-Ray Photoelectron Spectroscopy, the Inner-Shell-Electron Energy-Loss Spectroscopy Studies of MTe2 and M3SiTe6 (M=Nb and Ta)

Author： Ohno Y.  

Publisher： Academic Press

ISSN： 0022-4596

Source： Journal of Solid State Chemistry, Vol.142, Iss.1, 1999-01, pp. : 63-73

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