Coupled ultrathin InAs layers in GaAs as a tool for the determination of band offsets

Author: Brubach J.   Silov A.Y.   Haverkort J.E.M.   van der Vleuten W.   Wolter J.H.  

Publisher: Academic Press

ISSN: 0749-6036

Source: Superlattices and Microstructures, Vol.21, Iss.4, 1997-04, pp. : 527-532

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