Carrier conduction in a Si-nanocrystal-based single-electron transistor-II. Effect of drain bias

Author： Fu Y.   Willander M.   Dutta A.   Oda S.  

Publisher： Academic Press

ISSN： 0749-6036

Source： Superlattices and Microstructures, Vol.28, Iss.3, 2000-09, pp. : 189-198

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