Systematic Materials Analysis

Author: Richardson   J. H.  

Publisher: Elsevier Science‎

Publication year: 2012

E-ISBN: 9780323147569

P-ISBN(Paperback): 9780125878043

P-ISBN(Hardback):  9780125878043

Subject: TB302 engineering material test

Language: ENG

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Description

Systematic Materials Analysis, Volume IV presents refined instrumental methods available for materials analysis, which involves the complete characterization of a material, including structural and textural analyses in addition to chemical analysis.

This volume is composed of 11 chapters. Each chapter on specific instruments outlines the theories of operation and describes their capability for qualitative and quantitative measurements of chemical composition, structure, and texture. The sensitivity and selectivity of each method are emphasized.
The specific techniques and instruments covered in this book include the atomic-absorption and atomic-fluorescence flame photometry, ion microprobe, mass spectrometry, neutron diffractometry, polarimetry, polarography, dynamic thermal analysis, and transmission electron microscopy.

This book is intended primarily to materials analysts, engineers, researchers, and undergraduate and graduate level students.

Chapter

Front Cover

pp.:  1 – 4

Copyright Page

pp.:  5 – 8

Table of Contents

pp.:  8 – 12

List of Contributors

pp.:  12 – 14

Preface

pp.:  14 – 16

Acknowledgments

pp.:  16 – 18

Contents of Other Volumes

pp.:  18 – 20

Chapter 31. Ion Microprobe

pp.:  72 – 110

Chapter 32. Mass Spectrometry

pp.:  110 – 152

Chapter 33. Molecular Weight Determinations

pp.:  152 – 172

Chapter 34. Neutron Diffractometry

pp.:  172 – 202

Chapter 35. Particulate Characterization

pp.:  202 – 224

Chapter 36. Polarimetry

pp.:  224 – 244

Chapter 37. Polarography and Related Methods

pp.:  244 – 288

Chapter 38. Methods for the Detection of Noncentrosymmetry in Solids

pp.:  288 – 362

Chapter 39. Dynamic Thermal Analysis

pp.:  362 – 426

Chapter 40. Transmission Electron Microscopy

pp.:  426 – 496

Author Index

pp.:  496 – 507

Subject Index

pp.:  507 – 513

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