Practical Fourier Transform Infrared Spectroscopy ：Industrial and laboratory chemical analysis

Publication subTitle ：Industrial and laboratory chemical analysis

Author： Ferraro   John R.  

Publisher： Elsevier Science‎

Publication year： 2012

E-ISBN: 9780323146401

P-ISBN(Paperback): 9780122541254

P-ISBN(Hardback):  9780122541254

Subject： O657.31 Atomic emission spectroscopy.

Language： ENG

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Description

Practical Fourier Transform Infrared Spectroscopy: Industrial and Laboratory Chemical Analysis presents the Fourier Transform Infrared Spectroscopy (FT-IR) as a valuable analytic tool in solving industrial and laboratory chemical problems.

The text provides chapters that deal with the various applications of FT-IR such as the characterization of organic and inorganic superconductors; the study of forensic materials such as controlled drug particles, fragments of polymers, textile fibers, and explosives; identification and quantification of impurities and measurement of epitaxial thickness in silicon; bulk and surface studies and microanalyses of industrial materials; and the identification or determination of unknown compounds.

Chemists, industrial researchers, and product engineers will find the book useful.

Chapter

Front Cover

pp.：  1 – 4

Practical Fourier Transform Infrared Spectroscopy: Industrial and Laboratory Chemical Analysis

pp.：  4 – 5

Copyright Page

pp.：  5 – 6

Table of Contents

pp.：  6 – 10

Contributors

pp.：  10 – 12

Preface

pp.：  12 – 14

Acknowledgments

pp.：  14 – 16

Chapter 1. The Use of Vibrational Spectroscopy in the Characterization of High-Critical-Temperature Ceramic Superconductors

pp.：  16 – 56

Chapter 2. The Use of Vibrational Spectroscopy in the Characterization of Synthetic Organic Electrical Conductors and Superconductor

pp.：  56 – 118

Chapter 3. FT-IR Microsampling Techniques

pp.：  118 – 182

Chapter 4. Possibilities and Limitations of FT-Raman Spectroscopy

pp.：  182 – 218

Chapter 5. Vibrational Circular Dichroism : Comparison of Techniques and Practical Considerations

pp.：  218 – 300

Chapter 6. Characterization of Semiconductor Silicon Using Fourier Transform Infrared Spectroscopy

pp.：  300 – 366

Chapter 7. Industrial Applications of FT-IR

pp.：  366 – 410

Chapter 8. Multivariate Calibration Methods Applied to Quantitative FT-IR Analyses

pp.：  410 – 484

Chapter 9. Industrial Applications of GC/FT-IR

pp.：  484 – 534

Index

pp.：  534 – 550

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