Diffraction From Materials

Author: Schwartz   L. H.  

Publisher: Elsevier Science‎

Publication year: 2012

E-ISBN: 9780323145527

P-ISBN(Paperback): 9780126325508

P-ISBN(Hardback):  9780126325508

Subject: O571.5 neutron physics

Language: ENG

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Description

Diffraction from Materials provides the basic information concerning crystal symmetry, the kinematic scattering theory, as well as the physical properties of x-rays, electrons, and neurons. This book explores the crystalline nature of metals, semiconductors, and insulators.
Organized into eight chapters, this volume starts with an overview of the basic ideas associated with the arrangements of atoms in crystals to help readers understand why diffraction studies are useful in learning about crystals. This book considers the analytical and geometrical methods to represent the symmetry relationships for the atoms in crystals. Other chapters examine the production of radiation suitable for diffraction from materials. The final chapter examines the various techniques for x-ray topography, including the Schulz technique, the Guinier and Tennevin technique, and the Berg–Barret method.
This book is a valuable resource for electrical, civil, mechanical, and chemical engineers. This text will also be useful to materials scientists, chemists, biologists, and physicists.

Chapter

Front Cover

pp.:  1 – 4

Diffraction from Materials

pp.:  4 – 5

Copyright Page

pp.:  5 – 8

Dedication

pp.:  6 – 12

Table of Contents

pp.:  8 – 6

PREFACE

pp.:  12 – 16

ACKNOWLEDGMENTS

pp.:  16 – 18

Chapter 2. Geometrical Representations of Crystals

pp.:  63 – 97

Chapter 3. The Nature of Diffraction

pp.:  97 – 135

Chapter 4. Properties of Radiation Useful for Studying the Structure of Materials

pp.:  135 – 217

Chapter 5. Recording the Diffraction Pattern

pp.:  217 – 286

Chapter 6. Determination of Crystal Structures

pp.:  286 – 379

Chapter 7. What Else Can We Learn from a Diffraction Experiment besides the Average Structure?

pp.:  379 – 459

Chapter 8. The Dynamical Theory of Diffraction

pp.:  459 – 534

Appendix A: Location of Useful Information in International Tables for Crystallography

pp.:  534 – 535

Appendix B: Crystallographic Classification of the 230 Space Groups

pp.:  535 – 537

Appendix C: Determination of the Power of the Direct Beam in X-Ray Diffraction

pp.:  537 – 548

Answers to Selected Problems

pp.:  548 – 570

INDEX

pp.:  570 – 576

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