Trace Analysis By Mass Spectrometry

Author: Ahearn   Arthur J.  

Publisher: Elsevier Science‎

Publication year: 2012

E-ISBN: 9780323140737

P-ISBN(Paperback): 9780120446506

P-ISBN(Hardback):  9780120446506

Subject: O657.6 Mass Spectrometry Analysis

Language: ENG

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Description

Trace Analysis by Mass Spectrometry deals with trace analysis of solids and liquids by mass spectrometric techniques. Topics include the physics and techniques of electrical discharge ion sources, transmission of ions through double focusing mass spectrometers, and detection and measurement of ions by ion-sensitive plates. The ion sources used are principally electrical discharge type sources.
This book is comprised of 14 chapters. The first several chapters focus on the basic physics of electrical discharge ion sources, double focusing mass spectrometry, and the measurement of arrays of mass resolved ion beams by electrical detection methods and with ion sensitive emulsions. The discussion then shifts to the problem of obtaining the chemical composition of the recorded mass resolved ion sample and relating this composition to that of the original sample. The chapters that follow describe specific techniques for analyzing special samples such as insulators, powders, microsamples, biological materials, reactive and low melting point substances, radioactive materials, and gases in solids. The remaining chapters include the use of laser ion sources in the analysis of solids and the analysis of surfaces particularly with sputter ion sources.
This book will be of interest to students and practitioners of physics and chemistry.

Chapter

Front Cover

pp.:  1 – 4

Copyright Page

pp.:  5 – 6

Table of Contents

pp.:  6 – 12

List of Contributors

pp.:  12 – 14

Preface

pp.:  14 – 16

Chapter 1. Introductory Review

pp.:  16 – 26

Chapter 2. Physics and Techniques of Electrical Discharge Ion Sources

pp.:  26 – 72

Chapter 3. The Transmission of Ions through Double Focusing Mass Spectrometers

pp.:  72 – 116

Chapter 4. Detection and Measurement of Ions by Ion-Sensitive Plates

pp.:  116 – 150

Chapter 5. Electrical Measurements of Mass Resolved Ion Beams

pp.:  150 – 194

Chapter 6. Interpretation of Mass Spectrograph Plates

pp.:  194 – 228

Chapter 7. Computer Techniques for Solids Analysis

pp.:  228 – 254

Chapter 8. Relating the Mass Spectrum to the Solid Sample Composition

pp.:  254 – 312

Chapter 9. Insulators, Powders, and Microsamples

pp.:  312 – 338

Chapter 10. The Analysis of Low-Melting and Reactive Samples

pp.:  338 – 362

Chapter 11. The Analysis of Radioactive Samples by Spark-Source Mass Spectrometry

pp.:  362 – 384

Chapter 12. The Analysis of Gases in Solids

pp.:  384 – 416

Chapter 13. Surface and Thin Films Analysis

pp.:  416 – 438

Chapter 14. Laser Ion Source Analysis of Solids

pp.:  438 – 460

Author Index

pp.:  460 – 470

Subject Index

pp.:  470 – 476

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