Ion Beam Handbook for Material Analysis

Author: Mayer   James W.;Rimini   E.  

Publisher: Elsevier Science‎

Publication year: 2012

E-ISBN: 9780323139861

P-ISBN(Paperback): 9780124808607

P-ISBN(Hardback):  9780124808607

Subject: O469 Condensed Matter Physics

Language: ENG

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Description

Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program. The book provides a useful collection of tables, graphs, and formulas for those involved in ion beam analysis. These tables, graphs, and formulas are divided into five chapters that cover the following topics: energy loss and energy straggling; backscattering spectrometry; channeling; applications of ion-induced nuclear reactions; and the use of ion-induced X-ray yields.

Chapter

Front Cover

pp.:  1 – 4

Copyright Page

pp.:  5 – 6

Table of Contents

pp.:  6 – 8

Preface

pp.:  10 – 12

CHAPTER 2. BACKSCATTERING SPECTROMETRY

pp.:  44 – 90

CHAPTER 3. CHANNELING

pp.:  90 – 132

CHAPTER 4. SELECTED LOW ENERGY NUCLEAR REACTION DATA

pp.:  132 – 334

CHAPTER 5. ION INDUCED X-RAYS

pp.:  334 – 508

INDEX

pp.:  508 – 512

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