Ion Beams for Materials Analysis
Author： Bird R. Curtis;Williams J. S.
Publisher： Elsevier Science
Publication year： 1990
E-ISBN: 9780080916897
P-ISBN(Paperback): 9780120997404
P-ISBN(Hardback): 9780120997404
Subject： TB302.5 organizations, non - destructive test method
Language： ENG
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Description
The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.
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