Front Cover

pp.：  1 – 4

Measurement of High-Speed Signals in Solid State Devices

pp.：  4 – 5

Copyright Page

pp.：  5 – 8

Contents

pp.：  8 – 12

List of Contributors

pp.：  12 – 14

Preface

pp.：  14 – 18

Chapter 1. Materials and Devices for High-Speed Devices and Optoelectronic Applications

pp.：  18 – 58

Chapter 2. Electronic Wafer Probing Techniques

pp.：  58 – 102

Chapter 3. Picosecond Photoconductivity: High-Speed Measurements of Devices and Materials

pp.：  102 – 152

Chapter 4. Electro-Optic Measurement Techniques for Picosecond Materials. Devices and Integrated Circuits

pp.：  152 – 238

Chapter 5. Direct Optical Probing of Integrated Circuits and High-Speed Devices

pp.：  238 – 352

Chapter 6. Electron-Beam Probing

pp.：  352 – 400

Chapter 7. Photoemissive Probing

pp.：  400 – 438

Glossary of Symbols

pp.：  438 – 440

Index

pp.：  440 – 448

Contents of Previous Volumes

pp.：  448 – 456