Semiconductors and Semimetals ( Volume 17 )

Publication series :Volume 17

Author: Gibbons   James F.  

Publisher: Elsevier Science‎

Publication year: 1984

E-ISBN: 9780080864075

P-ISBN(Paperback): 9780127521176

P-ISBN(Hardback):  9780127521176

Subject: TN304 material

Language: ENG

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Description

Semiconductors and Semimetals

Chapter

Front Cover

pp.:  1 – 4

Copyright Page

pp.:  5 – 6

Contents

pp.:  6 – 10

List of Contributers

pp.:  10 – 12

Preface

pp.:  12 – 14

Chapter 2. Temperature Distributions and Solid Phase Reaction Rates Produced by Scanning CW Beams

pp.:  84 – 120

Chapter 3. Applications of CW Beam Processing to Ion Implanted Crystalline Silicon

pp.:  120 – 190

Chapter 4. Electronic Defects in CW Transient Thermal Processed Silicon

pp.:  190 – 240

Chapter 5. Beam Recrystallized Polycrystalline Silicon: Properties. Applications. and Techniques

pp.:  240 – 354

Chapter 6. Metal…Silicon Reactions and Silicide Formation

pp.:  354 – 410

Chapter 7. CW Beam Processing of Gallium Arsenide

pp.:  410 – 460

Index

pp.:  460 – 466

Contents of Previous Volumes

pp.:  466 – 472

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