Atomic, Molecular, and Optical Physics: Charged Particles :Charged Particles ( Volume 29A )

Publication subTitle :Charged Particles

Publication series :Volume 29A

Author: Dunning   F. B.;Hulet   Randall G.  

Publisher: Elsevier Science‎

Publication year: 1995

E-ISBN: 9780080860176

P-ISBN(Paperback): 9780124759749

P-ISBN(Hardback):  9780124759749

Subject: O56 molecular physics, atomic physics

Language: ENG

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Description

With this volume, Methods of Experimental Physics becomes Experimental Methods in the Physical Sciences, a name change which reflects the evolution of todays science. This volume is the first of three which will provide a comprehensive treatment of the key experimental methods of atomic, molecular, and optical physics; the three volumes as a set will form an excellent experimental handbook for the field. The wide availability of tunable lasers in the pastseveral years has revolutionized the field and lead to the introduction of many new experimental methods that are covered in these volumes. Traditional methods are also included to ensure that the volumes will be a complete reference source for the field.

Chapter

Front Cover

pp.:  1 – 4

Copyright Page

pp.:  5 – 6

Contents

pp.:  6 – 14

Contributors

pp.:  14 – 16

Preface

pp.:  16 – 18

List of Volumes in Treatise

pp.:  18 – 22

Chapter 2. Positron and Positronium Sources

pp.:  60 – 90

Chapter 3. Sources of Low-Charge-State Positive-Ion Beams

pp.:  90 – 190

Chapter 4. Advanced Sources of Highly Charged Ions

pp.:  190 – 210

Chapter 5. Electron and Ion Optics

pp.:  210 – 230

Chapter 6. Electron Energy Analyzers

pp.:  230 – 252

Chapter 7. Electron Polarimetry

pp.:  252 – 274

Chapter 8. Position Sensitive Particle Detection with Microchannel-Plate Electron Multipliers

pp.:  274 – 294

Chapter 9. Swarm Techniques

pp.:  294 – 320

Chapter 10. Accelerator-Based Atomic Physics

pp.:  320 – 342

Chapter 11. Ion Mass Analyzers

pp.:  342 – 370

Chapter 12. Ion Traps

pp.:  370 – 384

Chapter 13. Ultra-High-Resolution Mass Spectroscopy in Penning Traps

pp.:  384 – 412

Chapter 14. Electron Beam Ion Traps

pp.:  412 – 442

Chapter 15. DC Current Measurements

pp.:  442 – 458

Chapter 16. Signal Enhancement

pp.:  458 – 474

Index

pp.:  474 – 486

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