Three Dimensional Surface Topography

Author: Stout   Ken J;Blunt   Liam  

Publisher: Elsevier Science‎

Publication year: 2000

E-ISBN: 9780080542980

P-ISBN(Paperback): 9781857180268

P-ISBN(Hardback):  9781857180268

Subject: TN27 display technology

Language: ENG

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Description

This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography.

It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

Chapter

Front Cover

pp.:  1 – 4

Copyright Page

pp.:  5 – 6

Contents

pp.:  6 – 12

List of Figures

pp.:  12 – 18

List of Tables

pp.:  18 – 20

Contributors

pp.:  20 – 22

Preface to Second Edition

pp.:  22 – 24

Part I: Development of Surface Characterization

pp.:  24 – 42

Part II: Instruments and Measurement Techniques of Three-Dimensional Surface Topography

pp.:  42 – 118

Part III: Filtering Technology for Three-Dimensional Surface Topography Analysis

pp.:  118 – 166

Part IV: Visualization Techniques and Parameters for Characterizing Three-Dimensional Surface Topography

pp.:  166 – 198

Part V: Applications of Three-Dimensional Surface Metrology

pp.:  198 – 238

Part VI: Engineered Surfaces – A Philosophy of Manufacture

pp.:  238 – 276

Part VII: Bibliography

pp.:  276 – 306

Index

pp.:  306 – 310

The users who browse this book also browse


No browse record.