Author: Stout Ken J;Blunt Liam
Publisher: Elsevier Science
Publication year: 2000
E-ISBN: 9780080542980
P-ISBN(Paperback): 9781857180268
P-ISBN(Hardback): 9781857180268
Subject: TN27 display technology
Language: ENG
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Description
This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography.
It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.
Chapter