Author: Beyne Eric Hoof Rita Van Webers Tomas Brebels Steven Rossi Stéphanie Lechleiter François Ianni Marianna Di Ostmann Andreas
Publisher: Emerald Group Publishing Ltd
ISSN: 1356-5362
Source: Microelectronics International, Vol.18, Iss.3, 2001-12, pp. : 36-42
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Advances in microwave MCM-D technology
By Pieters Philip Raedt Walter De Beyne Eric
Microelectronics International, Vol. 17, Iss. 2, 2000-02 ,pp. :
Simulations of Dislocations in CdZnTe/SL/Si Substrates
Journal of Electronic Materials, Vol. 39, Iss. 7, 2010-07 ,pp. :