![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Zheng Yulan Atkinson John Zhang Zhige Sion Russ
Publisher: Emerald Group Publishing Ltd
ISSN: 1356-5362
Source: Microelectronics International, Vol.19, Iss.1, 2002-04, pp. : 33-37
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Atkinson J.K. Sion R.P. Zhang Z
Microelectronics International, Vol. 18, Iss. 1, 2001-01 ,pp. :