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Journal of Electron Microscopy, Vol. 53, Iss. 3, 2004-06 ,pp. : 267-270

Oxford University Press

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Transmission Electron Microscopic Observation of Grain Boundaries in CVD Diamond Thin Films

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Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM

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Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling

By Eberg Espen   Monsen smund F.   Tybell Thomas   van Helvoort Antonius T. J.   Holmestad Randi  

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TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba 2 FeMoO 6

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Journal of Electron Microscopy, Vol. 54, Iss. 1, 2005-01 ,pp. : 61-65

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