Author: Hervieu M.
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.46, Iss.4, 1997-01, pp. : 263-269
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electron transport behaviour in Nb-doped SrTiO 3 bicrystals
Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. :