auto-tuning, focusing, astigmatism correction, contrast transfer function, HAADF-STEM, Fourier transform

Author： Baba N  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.50, Iss.3, 2001-05, pp. : 163-176

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Retrieval process of high‐resolution HAADF‐STEM images

By Nakanishi Nobuto  

Journal of Electron Microscopy, Vol. 51, Iss. 6, 2002-11 ,pp. : 383-390

Oxford University Press

Access to resources Recommend Favorite

HAADF-STEM study on the early stage of precipitation in aged Al-Ag alloys

By Konno Toyohiko J.  

Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 611-616

Oxford University Press

Access to resources Recommend Favorite

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis

By Peng Yiping  

Journal of Electron Microscopy, Vol. 53, Iss. 3, 2004-06 ,pp. : 257-266

Oxford University Press

Access to resources Recommend Favorite

Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation

By Tanaka N.  

Journal of Electron Microscopy, Vol. 46, Iss. 1, 1997-01 ,pp. : 33-43

Oxford University Press

Access to resources Recommend Favorite

TEM and HAADF-STEM study of a Au catalyst supported on a TiO 2 nano-rod

By Akita T.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 473-477

Oxford University Press

Access to resources Recommend Favorite