Author: Arudchelvan Y. Nishimura3 Y. Tokuda1 N. Sawada1 T. Shinozaki2 F. Fukumoto1 T.
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.51, Iss.3, 2002-05, pp. : 173-181
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