Atomic Resolution Electronic Structure in Silicon-Based Semiconductors

By Batson P. E.  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 51-58

Oxford University Press

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High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

By Liu J.   Takeguchi M.   Tanaka M.   Yasuda H.   Furuya K.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 541-544

Oxford University Press

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Nanomanipulation of biological samples using a compact atomic force microscope under scanning electron microscope observation

By Iwata Futoshi   Mizuguchi Yuya   Ko Hideyuki   Ushiki Tatsuo  

Journal of Electron Microscopy, Vol. 60, Iss. 6, 2011-12 ,pp. : 359-366

Oxford University Press

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Atomic Structure of a Defect Colony in Silicon Introduced during Neutron Irradiation in the JOYO Reactor

By Ohno Yutaka   Oshima Ryuichiro  

Journal of Electron Microscopy, Vol. 45, Iss. 5, 1996-10 ,pp. : 380-387

Oxford University Press

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Imaging of a single atomic column in silicon grain boundary

By Sawada H.  

Journal of Electron Microscopy, Vol. 51, Iss. 6, 2002-11 ,pp. : 353-357

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