Author: Watanabe* S.
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.52, Iss.1, 2003-03, pp. : 33-40
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Sueishi Y. Sakaguchi* N. Shibayama T. Kinoshita H. Takahashi H.
Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. :