A Statistically Harmonized Alignment-Classification in Image Space Enables Accurate and Robust Alignment of Noisy Images in Single Particle Analysis

Author: Kawata Masaaki   Sato Chikara  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.56, Iss.3, 2007-01, pp. : 83-92

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Abstract