Atomic force microscopy observation of the enamel roughness and depth profile after phosphoric acid etching

Author： Loyola-Rodriguez Juan Pablo Zavala-Alonso Veronica Reyes-Vela Enrique Patio-Marin Nuria Ruiz Facundo Anusavice Kenneth J.

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.59, Iss.2, 2010-04, pp. : 119-125

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

In situ quantitative analysis of etching process of human teeth by atomic force microscopy

By Watari Fumio

Journal of Electron Microscopy, Vol. 54, Iss. 3, 2005-06 ,pp. : 299-308

Oxford University Press

Access to resources Recommend Favorite

Observation and Modification of the Surface of Some Organic Crystals by Means of Atomic Force Microscopy

By Riedo B.

Probe Microscopy, Vol. 2, Iss. 3-4, 2002-01 ,pp. : 235-239

Taylor & Francis Ltd

Access to resources Recommend Favorite

Aminomodified Probes for Atomic Force Microscopy

By Limansky A.P.

Probe Microscopy, Vol. 2, Iss. 3-4, 2002-01 ,pp. : 227-234

Taylor & Francis Ltd

Access to resources Recommend Favorite

Invasive Observation by Atomic Force Microscope of a Langmuir-Blodgett Monolayer of Gramicidin

By Demange V.

Probe Microscopy, Vol. 2, Iss. 3-4, 2002-01 ,pp. : 213-218

Taylor & Francis Ltd

Access to resources Recommend Favorite

Atomic force microscopy analysis of bacteriophages ΦKZ and T4

By Matsko Nadezda

Journal of Electron Microscopy, Vol. 50, Iss. 5, 2001-11 ,pp. : 417-422

Oxford University Press

Access to resources Recommend Favorite