Author: Yaguchi Toshie Suzuki Makoto Watabe Akira Nagakubo Yasuhira Ueda Kota Kamino Takeo
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.60, Iss.3, 2011-06, pp. : 217-225
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Retrieval process of high‐resolution HAADF‐STEM images
Journal of Electron Microscopy, Vol. 51, Iss. 6, 2002-11 ,pp. :