Negative Attachment Cognitions and Emotional Distress in Mainland Chinese Adolescents: A Prospective Multiwave Test of Vulnerability-Stress and Stress Generation Models

Author: Cohen Joseph R.  

Publisher: Routledge Ltd

ISSN: 1537-4416

Source: Journal of Clinical Child & Adolescent Psychology, Vol.42, Iss.4, 2013-07, pp. : 531-544

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Abstract