Author: De Spiegeleer W. Vos G.
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.23, Iss.6, 1969-11, pp. : 619-619
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Conversion of Norelco fluorescent spectrograph to an X‐ray diffractometer
Acta Crystallographica, Vol. 7, Iss. 8‐9, 1954-09 ,pp. :
X-ray induced surface modification of aluminovanadate oxide
By Chenakin S.P. Silvy R. Kruse N.
Catalysis Letters, Vol. 102, Iss. 1-2, 2005-07 ,pp. :
On the setting of crystals for X‐ray diffraction work
Acta Crystallographica, Vol. 14, Iss. 2, 1961-02 ,pp. :