The Quantitative Determination of Surface Oxide Thickness on Deposited Metal Films by Combination Auger Spectroscopy and Inert Gas Ion Bombardment

Author: Holloway D. M.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.27, Iss.2, 1973-03, pp. : 95-98

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content