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By Arden William M.   Hirschfeld Tomas B.   Klainer Stanley M.   Mueller William A.  

Applied Spectroscopy, Vol. 28, Iss. 6, 1974-11 ,pp. : 554-557

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Picosecond Time-Resolved Raman Spectroscopy of Solids: Capabilities and Limitations for Fluorescence Rejection and the Influence of Diffuse Reflectance

By Everall Neil   Hahn Thomas   Matousek Pavel   Parker Anthony W.   Towrie Michael  

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Automated Fluorescence Rejection Using Shifted Excitation Raman Difference Spectroscopy

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Applied Spectroscopy, Vol. 56, Iss. 7, 2002-07 ,pp. : 834-845

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Fluorescence Interferences in Raman Scattering from Combustion Products

By Setchell R. E.   Aeschliman D. P.  

Applied Spectroscopy, Vol. 31, Iss. 6, 1977-11 ,pp. : 530-535

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Fluorescence Rejection in Resonance Raman Spectroscopy Using a Picosecond-Gated Intensified Charge-Coupled Device Camera

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