Reduction in Raman Intensities of Si+O Defect Bands in Quartz Glass by Thermal Treatment

Author: Aussenegg F. R.   Lippitsch M. E.   Schiefer E.   Deserno U.   Rosenberger D.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.32, Iss.6, 1978-11, pp. : 587-588

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