Author: Paul David W. Ewbank John D. Benston O. Joel Schäfer Lothar
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.37, Iss.2, 1983-03, pp. : 127-130
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Processor-controlled Microdensitometry
By Ewbank J. D. Bowers P. Pinegar J. Schäfer L.
Applied Spectroscopy, Vol. 35, Iss. 6, 1981-11 ,pp. :
Electron diffraction patterns from montmorillonite
Acta Crystallographica, Vol. 14, Iss. 10, 1961-10 ,pp. :
Crystal structure analysis from fine structure in electron diffraction patterns
Acta Crystallographica, Vol. 10, Iss. 1, 1957-01 ,pp. :