Warning to DCP Users! The Influence of a Damaged Entrance Slit on the Optical and Analytical Performance in Direct-Current Plasma–Atomic Emission Spectrometry

By Petersson L. R.   Frank A.  

Applied Spectroscopy, Vol. 45, Iss. 3, 1991-03 ,pp. : 498-500

Society for Applied Spectroscopy

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Direct Determination of Copper in Solids by Direct Current Argon Plasma Emission Spectrometry with Sample Introduction Using Laser Ablation

By Mitchell Peter G.   Sneddon Joseph   Radziemski Leon J.  

Applied Spectroscopy, Vol. 41, Iss. 1, 1987-01 ,pp. : 141-148

Society for Applied Spectroscopy

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A Simple Purge System for Determination of Sulfur Using the Direct-Current Plasma

By McCreary Terry W.   Long Gary L.  

Applied Spectroscopy, Vol. 43, Iss. 1, 1989-01 ,pp. : 170-172

Society for Applied Spectroscopy

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Electrochemical Preconcentration of Trace Metals for Simultaneous Multielement Determination by Inductively Coupled Plasma-Atomic Emission Spectrometry Utilizing Graphite-Cup Direct-Insertion Technique

By Abdullah Mohammad   Fuwa Keiichiro   Haraguchi Hiroki  

Applied Spectroscopy, Vol. 41, Iss. 5, 1987-07 ,pp. : 715-721

Society for Applied Spectroscopy

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Direct Determination of Metals in Soils and Sediments by Induction Heating-Electrothermal Vaporization (IH-ETV) Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES)

By Rybak Michael E.   Salin Eric D.  

Applied Spectroscopy, Vol. 55, Iss. 7, 2001-07 ,pp. : 816-821

Society for Applied Spectroscopy

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