Fourier Transform Spectrometry in the Far-Infrared to High-Microwave Spectral Region Using a Rapid-Scan Interferometer

Author： Richter W.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.38, Iss.5, 1984-09, pp. : 678-680

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