Author: Yap C. T. Kump P. Tang S. M. Wijesinghe L.
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.41, Iss.1, 1987-01, pp. : 80-84
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The calibration of microthermostats for X‐ray measurements on crystals
Acta Crystallographica, Vol. 8, Iss. 10, 1955-10 ,pp. :