Characterization of Oxidized Nickel (II) Dimethylglyoxime Using X-Ray Photoelectron Spectroscopy

Author： Young V. Y. Chang F. C. Cheng K. L.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.41, Iss.6, 1987-08, pp. : 994-1000

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