A Simple Kinetic Model for A Helium ICP

By Fannin H. B.   Miller D. C.   Seliskar C. J.  

Applied Spectroscopy, Vol. 41, Iss. 2, 1987-02 ,pp. : 173-176

Society for Applied Spectroscopy

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Simple Device to Accurately Position Image Standards for Calibrating High Spatial Resolution Optical Systems

By Coleman David M.   Sainz Mario A.  

Applied Spectroscopy, Vol. 35, Iss. 1, 1981-01 ,pp. : 125-126

Society for Applied Spectroscopy

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Spatial Distribution of Interference Effects in ICP Emission Analysis

By Roederer J. E.   Bastiaans G. J.   Fernandez M. A.   Fredeen K. J.  

Applied Spectroscopy, Vol. 36, Iss. 4, 1982-07 ,pp. : 383-389

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Coincidence Profiles for Sulfur Emission at 180.73 nm (Third Order) in ICP-AES

By Attar K. M.  

Applied Spectroscopy, Vol. 42, Iss. 8, 1988-11 ,pp. : 1493-1499

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A Quantum-Statistical Method for the Determination of Vertical Temperature Profiles in the ICP

By Curry D. L.   Fannin H. B.  

Applied Spectroscopy, Vol. 45, Iss. 2, 1991-02 ,pp. : 293-296

Society for Applied Spectroscopy

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