Attenuated Total Reflection FT-IR Spectroscopy to Measure Interfacial Reaction Kinetics at Silica Surfaces

Author: Parry D. B.   Harris J. M.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.42, Iss.6, 1988-08, pp. : 997-1004

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content