Quantitative Characterization of Raman Spectra of Vanadium Oxides Layered on SiO2

Author: Miyata H.   Tokuda S.   Yoshida T.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.43, Iss.3, 1989-03, pp. : 522-526

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Abstract