The Effect of Charge Traps on Raman Spectroscopy Using a Thomson-CSF Charge Coupled Device Detector

Author: Pemberton Jeanne E.   Sobocinski Raymond L.   Sims Gary R.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.44, Iss.2, 1990-02, pp. : 328-330

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